Rigaku to Debut DicifferX Microarea Edition X-Ray Diffractometer at JASIS 2026

Rigaku Unveils DicifferX Microarea Edition at JASIS 2026

Rigaku Corporation announced it will introduce the DicifferX Microarea Edition X-ray diffractometer at JASIS 2026, targeting materials characterization for components measuring only a few tens of micrometers. As electronic devices scale down, components like multilayer ceramic capacitors demand precise analysis at micro-scales. Conventional laboratory systems suffer from severe X-ray intensity loss when beam sizes shrink, alongside positional shifts caused by minor mechanical deflections.

The Tech TL;DR:

• Target Application: Materials characterization of micro-areas measuring a few tens of micrometers, specifically for miniaturized electronic components like multilayer ceramic capacitors.
• Core Hardware: Integrates a high-brilliance point-focus X-ray source, a multilayer focusing mirror, and a high-precision multi-axis goniometer with axis intersection correction.

• Detector Tech: Employs the HyPix-3000 2D detector for efficient data acquisition, supporting pole figure measurements, residual stress evaluation, and multipoint mapping.

DicifferX Microarea Edition Minimizes Irradiation Shifts

To combat the intensity drops and positional drift that typically force researchers to rely on synchrotron facilities, the DicifferX Microarea Edition uses a fixed incident X-ray source designed to structurally minimize factors causing irradiation shifts. Rigaku Corporation designed the system to maintain stable measurement intervals at the micro-scale within standard laboratory environments. Positional deviations unresolvable through mechanical precision alone are corrected via software integrated with the system’s high-precision multi-axis goniometer.

High-Brilliance Optics Increase X-Ray Intensity

The hardware configuration pairs a high-brilliance point-focus X-ray source with a multilayer focusing mirror. According to manufacturer specifications published by Rigaku, this pairing delivers approximately 100 times the X-ray intensity in the high-resolution configuration and roughly 330 times the intensity in the high-intensity configuration compared to general-purpose XRD systems. Diffraction data collection relies on the HyPix-3000 2D detector. The wide detection area of this unit facilitates qualitative and quantitative evaluations of minute discoloration and foreign materials.

Characterizing Densely Integrated Electronic Components

Jun Kawakami, president and CEO of Rigaku Corporation, stated in the company release that the new instrument represents a significant leap in characterizing increasingly miniaturized electronic components with unprecedented stability and precision. The capability to execute residual stress measurements, pole figure measurements, and multipoint mapping locally shifts advanced microarea analysis out of external facilities and directly into the lab.